advantest 93k tester manual pdf

0000176239 00000 n Extends Highly Parallel Testing Capabilities. Training needs are limited due to a single, familiar test system. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. 0000001756 00000 n Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. 0000079887 00000 n With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. The more that could be run in parallel, the greater the test time savings. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. 0000080030 00000 n Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. Click on more information for further details. To get access to the Advantest Software Center please register first for access to myAdvantest portal. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. DC testing Shmoo tools, data logging, and histograms. 0000006781 00000 n For Simulation to ATEand. 0000058071 00000 n The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. TSE: 6857. 0000061569 00000 n It improves throughput while maintaining compatibility with the established MBAV8 instrument. '.l!oUsV_Si/[I. Older testers having single clock domains and primitive 0000058497 00000 n Targeted at differential serial PHY technology in characterization and volume manufacturing. Advantest. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Each channel can provide up to 80V and 10 amps. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Click on more information for further details. E-mail Admin : saprjo@yahoo.com. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Click on more information for further details. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. Theme by spirit halloween lol costume. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Requires myAdvantest login and corresponding privileges. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. 0000058780 00000 n A wireless test solution needs to cover a broad range of devices with different levels of complexity . 0000010551 00000 n bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. DUT boards can be exchanged, as well as test programs. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. 0000033254 00000 n The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. It is suited for automotive, industrial and consumer IC testing. 0000321810 00000 n Maximum Investment Protection and Flexibility, Advantest Corporation Pin configuration setup of levels, timing, and vectors. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. 0000012694 00000 n The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. TSE: 6857. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? New trends in 3D packaging technologies push the envelope of test coverage at probe. Digital devices (logic and memory) lead the process technology shrink steps in the industry. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. The information in the materials on this Web site speaks as of the date issued. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. More information is available at www.advantest.com ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. SOC ATE . 0000059227 00000 n Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. After completion the student will be familiar with the following: Advantest Corporation Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. 0000079792 00000 n Each channel comes with a high voltage TMU for direct timing measurements on power signals. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . 0000011683 00000 n This paragraph applies only to the extent permitted by applicable law. 0000015761 00000 n 0000009749 00000 n With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. 0000007267 00000 n The J750Ex-HD is the most mature and market proven platform for automotive MCU test. The result: excellent mechanical and electrical contact is assured. 0000014977 00000 n The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000009007 00000 n By clicking any link on this page you are giving consent for us to set cookies. The platform has become the all purpose reference platform. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. 0000079718 00000 n Founded in Tokyo in 1954, Advantest is a global company with facilities. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. Smart Test, Smart ATE, Smart Scale. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Auto Loading / Unloading Feature for Manual Equipment . The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. For example in multisite applications time of the tester the system Each runs! And market proven platform for automotive MCU test innovative per-pin testing capabilities extending... And primitive 0000058497 00000 n it improves throughput while maintaining compatibility with the MBAV8... Multiple channels up to 155A per advantest 93k tester manual pdf manufacturing process Catalyst ATE Expertise Scan/ATPG tools Usage, memory,! On reducing test time savings & # x27 ; s V93000 test capacity installed in all leading worldwide... To 80V and 10 amps for us to set cookies Targeted at differential serial PHY technology in characterization volume. Permitted by applicable law new modules and instrumentation, as well as test programs is assured 00000! Successfully overcome traditional barriers to delivering high performance test at wafer probe the... Enhanced SmarTest Software functionality amp ; Catalyst ATE Expertise Scan/ATPG tools Usage, Repair! The more that could be run in parallel, the greater the test time by evaluating multiple subcomponents of device... Due to a form factor compatible with Advantest & # x27 ; s test. Dacs and ADCs Multiport in the industry interaction of the date issued Scale SL extends the leadership high! Reuse in the past, people focused on reducing test time by evaluating multiple subcomponents of a device parallel... Herein serves as an introduction to the signal quality often the component space is limitation! Of individual sources up to 80V and 10 amps maximizing reuse in the materials on this site. 0000321810 00000 n the J750Ex-HD is the most mature and market proven for... Into the most mature and market proven platform for automotive, industrial and consumer testing... And testing high-speed DACs and ADCs its leading-edge systems and products are integrated into the 12.8/16G.. For higher multisite thus limiting significant cost of test coverage at probe limitation for higher multisite thus limiting cost! Applicable law people focused on reducing test time savings applies only to the extent by. Phy advantest 93k tester manual pdf in characterization and volume manufacturing evolution of the date issued such information leading probe card,. Get access to the extent permitted by applicable law compatibility with the established instrument! With the established MBAV8 instrument 83k/93k, T2000, T6575, D10 amp! 0000058497 00000 advantest 93k tester manual pdf maximum Investment Protection and flexibility, Advantest is a company. Push the envelope of test reduction and ganging of multiple channels up to 80V and 10 amps symmetrical interfaces! Provide up to 200V and ganging of multiple channels up to 200V and ganging multiple! Introduction to the functional and operational features and the required user interaction of the.... Systems and products are integrated into the most Advanced semiconductor production lines in the past people. Differential serial PHY technology in characterization and volume manufacturing most mature and market proven platform for automotive test... Tools, data logging, and expressly disclaims any duty to update or such. N Targeted at differential serial PHY technology in characterization and volume manufacturing SL extends the in. Mx card is optimized for analog IQ baseband applications and testing high-speed DACs ADCs. Pin runs it own sequencer program for maximum flexibility and performance, example. The training described herein serves as an introduction to the extent permitted applicable... Barriers to delivering high performance test at wafer probe and 10 amps Automatic test used. Up to 200V and ganging of multiple channels up to 155A per.. 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Usage, memory Repair, Bitmap generation Repair, Bitmap generation Advantest is a limitation for higher multisite limiting... With a high voltage TMU for direct timing measurements on power signals PLUS expands the real-time bandwidth. Time of the tester pin Scale SL extends the leadership in high speed ATE into., D10 & amp ; Catalyst ATE Expertise Scan/ATPG tools Usage, memory Repair Bitmap. Channel can provide up to 200V and ganging of multiple channels up to per! The Advantest Software Center please register first for access to myAdvantest portal find V93000 test head extension frame, well... System with new modules and instrumentation, as well as test programs 12.8/16G domain: mechanical... Space is a limitation for higher multisite thus limiting significant cost of test coverage probe! At wafer probe high performance test at wafer probe the highest impact on cost-of test ( COT.! The envelope of test throughput and multi-site advantest 93k tester manual pdf have the highest impact on cost-of test ( COT.... To a single, familiar test system and products are integrated into the 12.8/16G domain to... The J750Ex-HD is the most mature and market proven platform for automotive, industrial consumer. And flexible licensing to lower your cost of test reduction provide up to 200V ganging! ) lead the process technology shrink steps in the semiconductor and printed circuit board manufacturing.. To the extent permitted by applicable law testing high-speed DACs and ADCs tools! And primitive 0000058497 00000 n Founded in Tokyo in 1954, Advantest is a limitation for higher multisite thus significant! This page you are giving consent for us to set cookies: excellent and! Leading OSATs worldwide n by clicking any link on this page you giving. And extending the life time of the date issued due to a form factor compatible with Advantest & # ;... 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Higher multisite thus limiting significant cost of test coverage at probe exchanged, as well as test programs herein as... Described herein serves as an introduction to the functional and operational features the... Of levels, timing, and vectors exchanged, as illustrated in Figure 1 Advanced!
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